Analog mean delay method (AMD) for real-time fluorescence lifetime microscopy (FLIM)

Sucbei Moon; Youngjae Won; Dug Young Kim

doi:10.1117/12.848242

Analog mean delay method (AMD) for real-time fluorescence lifetime microscopy (FLIM)

Sucbei Moon, Youngjae Won, Dug Young Kim

Department of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We present a new high-speed lifetime measurement scheme of analog mean-delay (AMD) method which is suitable for studying dynamical time-resolved spectroscopy and high-speed fluorescence lifetime imaging microscopy (FLIM). In our lifetime measurement method, the time-domain intensity of a decaying fluorescence light source is acquired as an analog waveform, and the lifetime information of the source is extracted from the calculated mean temporal delay of the waveform.

Original language	English
Title of host publication	2009 International Conference on Optical Instruments and Technology - Optical Systems and Modern Optoelectronic Instruments
DOIs	https://doi.org/10.1117/12.848242
Publication status	Published - 2009
Event	2009 International Conference on Optical Instruments and Technology, OIT 2009 - Shanghai, China Duration: 2009 Oct 19 → 2009 Oct 22

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	7506
ISSN (Print)	0277-786X

Other

Other	2009 International Conference on Optical Instruments and Technology, OIT 2009
Country/Territory	China
City	Shanghai
Period	09/10/19 → 09/10/22

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.848242

Cite this

Moon, S., Won, Y., & Kim, D. Y. (2009). Analog mean delay method (AMD) for real-time fluorescence lifetime microscopy (FLIM). In 2009 International Conference on Optical Instruments and Technology - Optical Systems and Modern Optoelectronic Instruments Article 750605 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7506). https://doi.org/10.1117/12.848242

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title = "Analog mean delay method (AMD) for real-time fluorescence lifetime microscopy (FLIM)",

abstract = "We present a new high-speed lifetime measurement scheme of analog mean-delay (AMD) method which is suitable for studying dynamical time-resolved spectroscopy and high-speed fluorescence lifetime imaging microscopy (FLIM). In our lifetime measurement method, the time-domain intensity of a decaying fluorescence light source is acquired as an analog waveform, and the lifetime information of the source is extracted from the calculated mean temporal delay of the waveform.",

author = "Sucbei Moon and Youngjae Won and Kim, {Dug Young}",

year = "2009",

doi = "10.1117/12.848242",

language = "English",

isbn = "9780819478924",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

booktitle = "2009 International Conference on Optical Instruments and Technology - Optical Systems and Modern Optoelectronic Instruments",

note = "2009 International Conference on Optical Instruments and Technology, OIT 2009 ; Conference date: 19-10-2009 Through 22-10-2009",

}

Moon, S, Won, Y & Kim, DY 2009, Analog mean delay method (AMD) for real-time fluorescence lifetime microscopy (FLIM). in 2009 International Conference on Optical Instruments and Technology - Optical Systems and Modern Optoelectronic Instruments., 750605, Proceedings of SPIE - The International Society for Optical Engineering, vol. 7506, 2009 International Conference on Optical Instruments and Technology, OIT 2009, Shanghai, China, 09/10/19. https://doi.org/10.1117/12.848242

Analog mean delay method (AMD) for real-time fluorescence lifetime microscopy (FLIM). / Moon, Sucbei; Won, Youngjae; Kim, Dug Young.
2009 International Conference on Optical Instruments and Technology - Optical Systems and Modern Optoelectronic Instruments. 2009. 750605 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7506).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

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AU - Moon, Sucbei

AU - Won, Youngjae

AU - Kim, Dug Young

PY - 2009

Y1 - 2009

N2 - We present a new high-speed lifetime measurement scheme of analog mean-delay (AMD) method which is suitable for studying dynamical time-resolved spectroscopy and high-speed fluorescence lifetime imaging microscopy (FLIM). In our lifetime measurement method, the time-domain intensity of a decaying fluorescence light source is acquired as an analog waveform, and the lifetime information of the source is extracted from the calculated mean temporal delay of the waveform.

AB - We present a new high-speed lifetime measurement scheme of analog mean-delay (AMD) method which is suitable for studying dynamical time-resolved spectroscopy and high-speed fluorescence lifetime imaging microscopy (FLIM). In our lifetime measurement method, the time-domain intensity of a decaying fluorescence light source is acquired as an analog waveform, and the lifetime information of the source is extracted from the calculated mean temporal delay of the waveform.

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T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - 2009 International Conference on Optical Instruments and Technology - Optical Systems and Modern Optoelectronic Instruments

T2 - 2009 International Conference on Optical Instruments and Technology, OIT 2009

Y2 - 19 October 2009 through 22 October 2009

ER -

Analog mean delay method (AMD) for real-time fluorescence lifetime microscopy (FLIM)

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