An optimized test sequence satisfying the completeness criteria

Hongse Son; Daehun Nyang; Sangyong Lim; Jinho Park; Young Han Choe; Byungmun Chin; Jooseok Song

doi:10.1109/ICOIN.1998.648477

An optimized test sequence satisfying the completeness criteria

Hongse Son, Daehun Nyang, Sangyong Lim, Jinho Park, Young Han Choe, Byungmun Chin, Jooseok Song

College of Computing

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we show that the length of the test sequence satisfying the completeness can be reduced. Finally, we illustrate our technique on a specific example.

Original language	English
Title of host publication	Proceedings - 12th International Conference on Information Networking, ICOIN 1998
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	621-625
Number of pages	5
ISBN (Electronic)	0818672250, 9780818672255
DOIs	https://doi.org/10.1109/ICOIN.1998.648477
Publication status	Published - 1998
Event	12th International Conference on Information Networking, ICOIN 1998 - Koganei, Tokyo, Japan Duration: 1998 Jan 21 → 1998 Jan 23

Publication series

Name	Proceedings - 12th International Conference on Information Networking, ICOIN 1998

Conference

Conference	12th International Conference on Information Networking, ICOIN 1998
Country/Territory	Japan
City	Koganei, Tokyo
Period	98/1/21 → 98/1/23

Bibliographical note

Publisher Copyright:
© 1998 IEEE.

All Science Journal Classification (ASJC) codes

Computer Networks and Communications
Hardware and Architecture
Information Systems

Access to Document

10.1109/ICOIN.1998.648477

Cite this

Son, H., Nyang, D., Lim, S., Park, J., Choe, Y. H., Chin, B., & Song, J. (1998). An optimized test sequence satisfying the completeness criteria. In Proceedings - 12th International Conference on Information Networking, ICOIN 1998 (pp. 621-625). (Proceedings - 12th International Conference on Information Networking, ICOIN 1998). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICOIN.1998.648477

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title = "An optimized test sequence satisfying the completeness criteria",

abstract = "We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we show that the length of the test sequence satisfying the completeness can be reduced. Finally, we illustrate our technique on a specific example.",

author = "Hongse Son and Daehun Nyang and Sangyong Lim and Jinho Park and Choe, {Young Han} and Byungmun Chin and Jooseok Song",

note = "Publisher Copyright: {\textcopyright} 1998 IEEE.; 12th International Conference on Information Networking, ICOIN 1998 ; Conference date: 21-01-1998 Through 23-01-1998",

year = "1998",

doi = "10.1109/ICOIN.1998.648477",

language = "English",

series = "Proceedings - 12th International Conference on Information Networking, ICOIN 1998",

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Son, H, Nyang, D, Lim, S, Park, J, Choe, YH, Chin, B & Song, J 1998, An optimized test sequence satisfying the completeness criteria. in Proceedings - 12th International Conference on Information Networking, ICOIN 1998. Proceedings - 12th International Conference on Information Networking, ICOIN 1998, Institute of Electrical and Electronics Engineers Inc., pp. 621-625, 12th International Conference on Information Networking, ICOIN 1998, Koganei, Tokyo, Japan, 98/1/21. https://doi.org/10.1109/ICOIN.1998.648477

An optimized test sequence satisfying the completeness criteria. / Son, Hongse; Nyang, Daehun; Lim, Sangyong et al.
Proceedings - 12th International Conference on Information Networking, ICOIN 1998. Institute of Electrical and Electronics Engineers Inc., 1998. p. 621-625 (Proceedings - 12th International Conference on Information Networking, ICOIN 1998).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - An optimized test sequence satisfying the completeness criteria

AU - Son, Hongse

AU - Nyang, Daehun

AU - Lim, Sangyong

AU - Park, Jinho

AU - Choe, Young Han

AU - Chin, Byungmun

AU - Song, Jooseok

PY - 1998

Y1 - 1998

N2 - We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we show that the length of the test sequence satisfying the completeness can be reduced. Finally, we illustrate our technique on a specific example.

AB - We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we show that the length of the test sequence satisfying the completeness can be reduced. Finally, we illustrate our technique on a specific example.

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M3 - Conference contribution

AN - SCOPUS:33646249492

T3 - Proceedings - 12th International Conference on Information Networking, ICOIN 1998

SP - 621

EP - 625

BT - Proceedings - 12th International Conference on Information Networking, ICOIN 1998

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 12th International Conference on Information Networking, ICOIN 1998

Y2 - 21 January 1998 through 23 January 1998

ER -

Son H, Nyang D, Lim S, Park J, Choe YH, Chin B et al. An optimized test sequence satisfying the completeness criteria. In Proceedings - 12th International Conference on Information Networking, ICOIN 1998. Institute of Electrical and Electronics Engineers Inc. 1998. p. 621-625. (Proceedings - 12th International Conference on Information Networking, ICOIN 1998). doi: 10.1109/ICOIN.1998.648477

An optimized test sequence satisfying the completeness criteria

Abstract

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Bibliographical note

All Science Journal Classification (ASJC) codes

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