TY - GEN
T1 - An industrial case study for x-canceling MISR
AU - Yang, Joon Sung
AU - Touba, Nur A.
AU - Yang, Shih Yu
AU - Mak, T. M.
PY - 2009/12/15
Y1 - 2009/12/15
N2 - An X-tolerant multiple-input signature register (MISR) compaction methodology that compacts output streams containing unknown (X) values was described in [Touba 07]. Unlike conventional approaches, it does not use Xmasking logic at the input of the MISR. Instead it uses symbolic simulation to express each bit of the MISR signature as a linear equation in terms of the X's. Linearly dependent combinations of the signature bits are identified with Gaussian elimination and XORed together to cancel out all X values and yield deterministic values. This new X-canceling approach was applied to some industrial designs under the constraints imposed by an industrial test environment. Practical issues for implementing X-canceling are discussed, and a new architecture for implementing X-canceling based on using a shadow register with multiple selective XORs is presented. Experimental results are shown for industrial designs comparing the performance of X-canceling with X-compact.
AB - An X-tolerant multiple-input signature register (MISR) compaction methodology that compacts output streams containing unknown (X) values was described in [Touba 07]. Unlike conventional approaches, it does not use Xmasking logic at the input of the MISR. Instead it uses symbolic simulation to express each bit of the MISR signature as a linear equation in terms of the X's. Linearly dependent combinations of the signature bits are identified with Gaussian elimination and XORed together to cancel out all X values and yield deterministic values. This new X-canceling approach was applied to some industrial designs under the constraints imposed by an industrial test environment. Practical issues for implementing X-canceling are discussed, and a new architecture for implementing X-canceling based on using a shadow register with multiple selective XORs is presented. Experimental results are shown for industrial designs comparing the performance of X-canceling with X-compact.
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U2 - 10.1109/TEST.2009.5355687
DO - 10.1109/TEST.2009.5355687
M3 - Conference contribution
AN - SCOPUS:76549101319
SN - 9781424448678
T3 - Proceedings - International Test Conference
BT - International Test Conference, ITC 2009 - Proceedings
T2 - International Test Conference, ITC 2009
Y2 - 1 November 2009 through 6 November 2009
ER -