An effective test pattern generation for testing signal integrity

Yongjoon Kim, Myung Hoon Yang, Youngkyu Park, Dae Yeal Lee, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


As more cores are integrated in a single chip with sophisticated process like nano technology, testing signal integrity between the cores needs much effort due to complicate coupling effects. In this paper, we propose a novel test pattern generation method for testing signal integrity. Using this method, short and effective test patterns are generated with low hardware overhead. It can be used for self-test scheme and experimental results show the effectiveness of the proposed scheme.

Original languageEnglish
Title of host publicationProceedings of the 15th Asian Test Symposium 2006
Number of pages6
Publication statusPublished - 2006
Event15th Asian Test Symposium 2006 - Fukuoka, Japan
Duration: 2006 Nov 202006 Nov 23

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735


Other15th Asian Test Symposium 2006

Bibliographical note

Funding Information:
This research was supported in part by a research grant from Southern Illinois University at Edwardsville. I thank graduate students, HyungJun Cho, Ming Zhou, and Murali Neralla, for their assistance in coding the analytical method and simulation and running the experiments. I also thank the department editor and anonymous referees for their useful comments.

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering


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