An effective test and diagnosis algorithm for dual-port memories

Youngkyu Park, Myung Hoon Yang, Yongjoon Kim, Dae Yeal Lee, Sungho Kang

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)


This paper proposes a test algorithm that can detect and diagnose all the faults occurring in dual-port memories that can be accessed simultaneously through two ports. In this paper, we develop a new diagnosis algorithm that classifies faults in detail when they are detected while the test process is being developed. The algorithm is particularly efficient because it uses information that can be obtained by test results as well as results using an additional diagnosis pattern. The algorithm can also diagnose various fault models for dual-port memories.

Original languageEnglish
Pages (from-to)555-564
Number of pages10
JournalETRI Journal
Issue number4
Publication statusPublished - 2008 Aug

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • General Computer Science
  • Electrical and Electronic Engineering


Dive into the research topics of 'An effective test and diagnosis algorithm for dual-port memories'. Together they form a unique fingerprint.

Cite this