We have investigated distortions in the axial position calculations of a sample in lens-free digital inline holography (LDIH). Three-dimensional structure of a sample can be accurately obtained through a series of processes in LDIH, Fourier-domain digital filtering, and numerical focusing. The axial information of a sample is calculated through numerical beam propagation using diffraction theory and can be easily distorted because of approximations and assumptions used in the diffraction formula and the numerical beam propagation analysis used in LDIH. Since the reference light in LDIH is normally a diverging spherical beam from a point source, axial information of a sample calculated by a numerical focusing algorithm with a plane reference beam is off from the real axial position of a sample. We propose an algorithm that can correct this distortion in LDIH.
|Title of host publication||Practical Holography XXXI|
|Subtitle of host publication||Materials and Applications|
|Editors||Hans I. Bjelkhagen, V. Michael Bove|
|Publication status||Published - 2017|
|Event||SPIE Conference on Practical Holography XXXI: Materials and Applications - San Francisco, United States|
Duration: 2017 Jan 30 → 2017 Feb 1
|Name||Proceedings of SPIE - The International Society for Optical Engineering|
|Other||SPIE Conference on Practical Holography XXXI: Materials and Applications|
|Period||17/1/30 → 17/2/1|
Bibliographical noteFunding Information:
This work was financially supported by the MEST through the National Research Foundation of Korea (Grant No. 2012R1A4A1029061), the Center for Advanced Meta-Materials (CAMM) funded by the Ministry of Science, ICT and Future Planning as Global Frontier Project (CAMM-2014M3A6B3063712), the Technology Innovation Program (10062417) funded by the Ministry of Trade, industry & Energy (MI), and the Ministry of Education Science and Technology of Korea through the BK21 program.
© 2017 SPIE.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering