Abstract
This paper presents a fine-resolution time-to-digital converter (TDC) with a large dynamic range using a 3-D Vernier space. Despite the wide dynamic range, the required delay cells in the delay-lines are minimized, leading to better power efficiency. The proposed TDC also exploits the redundancy and error-correction technique to solve the offset error of coarse conversion in the 3-D Vernier space architecture. The TDC is implemented using a 0.13-μ m CMOS process. The measurement result shows a dynamic range with an 11-bit 6.98-ps resolution, an integrated nonlinearity of ± 1.5 LSB, a power consumption of 328.8 7mu; W, and a die area of 0.28 mm2.
Original language | English |
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Article number | 6747404 |
Pages (from-to) | 2326-2336 |
Number of pages | 11 |
Journal | IEEE Transactions on Circuits and Systems I: Regular Papers |
Volume | 61 |
Issue number | 8 |
DOIs | |
Publication status | Published - 2014 Aug |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering