AFSEM: Advanced frequent subcircuit extraction method by graph mining approach for optimized cell library developments

Byung Su Kim; Hyo Sig Won; Taehee Han; Joon Sung Yang

doi:10.1109/ISCAS.2016.7527327

AFSEM: Advanced frequent subcircuit extraction method by graph mining approach for optimized cell library developments

Byung Su Kim, Hyo Sig Won, Taehee Han, Joon Sung Yang

College of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

The optimization of cells and cell combinations used in design is critical to enhance the performance. If frequently used cell combinations are known in advance, a new cell development can be significantly optimized using the cell combinations for chip design. However, extracting frequent cell combinations is an NP hard problem. We propose a new framework, referring as AFSEM, to extract frequent cell combinations for design optimization. To solve this problem, we use a frequent subgraph mining method which is a process of discovering subgraphs. We present an advanced graph modeling and optimized frequent subgraph mining platform for a practical use. The experimental results with various designs demonstrate that the proposed method can discover various types of subcircuits for design optimization with various runtime optimization methods.

Original language	English
Title of host publication	ISCAS 2016 - IEEE International Symposium on Circuits and Systems
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	662-665
Number of pages	4
ISBN (Electronic)	9781479953400
DOIs	https://doi.org/10.1109/ISCAS.2016.7527327
Publication status	Published - 2016 Jul 29
Event	2016 IEEE International Symposium on Circuits and Systems, ISCAS 2016 - Montreal, Canada Duration: 2016 May 22 → 2016 May 25

Publication series

Name	Proceedings - IEEE International Symposium on Circuits and Systems
Volume	2016-July
ISSN (Print)	0271-4310

Other

Other	2016 IEEE International Symposium on Circuits and Systems, ISCAS 2016
Country/Territory	Canada
City	Montreal
Period	16/5/22 → 16/5/25

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/ISCAS.2016.7527327

Cite this

Kim, B. S., Won, H. S., Han, T., & Yang, J. S. (2016). AFSEM: Advanced frequent subcircuit extraction method by graph mining approach for optimized cell library developments. In ISCAS 2016 - IEEE International Symposium on Circuits and Systems (pp. 662-665). [7527327] (Proceedings - IEEE International Symposium on Circuits and Systems; Vol. 2016-July). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISCAS.2016.7527327

Kim, Byung Su ; Won, Hyo Sig ; Han, Taehee et al. / AFSEM : Advanced frequent subcircuit extraction method by graph mining approach for optimized cell library developments. ISCAS 2016 - IEEE International Symposium on Circuits and Systems. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 662-665 (Proceedings - IEEE International Symposium on Circuits and Systems).

@inproceedings{2a0771ad226246dda96900c31bf83ac1,

title = "AFSEM: Advanced frequent subcircuit extraction method by graph mining approach for optimized cell library developments",

abstract = "The optimization of cells and cell combinations used in design is critical to enhance the performance. If frequently used cell combinations are known in advance, a new cell development can be significantly optimized using the cell combinations for chip design. However, extracting frequent cell combinations is an NP hard problem. We propose a new framework, referring as AFSEM, to extract frequent cell combinations for design optimization. To solve this problem, we use a frequent subgraph mining method which is a process of discovering subgraphs. We present an advanced graph modeling and optimized frequent subgraph mining platform for a practical use. The experimental results with various designs demonstrate that the proposed method can discover various types of subcircuits for design optimization with various runtime optimization methods.",

author = "Kim, {Byung Su} and Won, {Hyo Sig} and Taehee Han and Yang, {Joon Sung}",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 2016 IEEE International Symposium on Circuits and Systems, ISCAS 2016 ; Conference date: 22-05-2016 Through 25-05-2016",

year = "2016",

month = jul,

day = "29",

doi = "10.1109/ISCAS.2016.7527327",

language = "English",

series = "Proceedings - IEEE International Symposium on Circuits and Systems",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "662--665",

booktitle = "ISCAS 2016 - IEEE International Symposium on Circuits and Systems",

address = "United States",

}

Kim, BS, Won, HS, Han, T & Yang, JS 2016, AFSEM: Advanced frequent subcircuit extraction method by graph mining approach for optimized cell library developments. in ISCAS 2016 - IEEE International Symposium on Circuits and Systems., 7527327, Proceedings - IEEE International Symposium on Circuits and Systems, vol. 2016-July, Institute of Electrical and Electronics Engineers Inc., pp. 662-665, 2016 IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montreal, Canada, 16/5/22. https://doi.org/10.1109/ISCAS.2016.7527327

AFSEM: Advanced frequent subcircuit extraction method by graph mining approach for optimized cell library developments. / Kim, Byung Su; Won, Hyo Sig; Han, Taehee et al.
ISCAS 2016 - IEEE International Symposium on Circuits and Systems. Institute of Electrical and Electronics Engineers Inc., 2016. p. 662-665 7527327 (Proceedings - IEEE International Symposium on Circuits and Systems; Vol. 2016-July).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - AFSEM

T2 - 2016 IEEE International Symposium on Circuits and Systems, ISCAS 2016

AU - Kim, Byung Su

AU - Won, Hyo Sig

AU - Han, Taehee

AU - Yang, Joon Sung

PY - 2016/7/29

Y1 - 2016/7/29

N2 - The optimization of cells and cell combinations used in design is critical to enhance the performance. If frequently used cell combinations are known in advance, a new cell development can be significantly optimized using the cell combinations for chip design. However, extracting frequent cell combinations is an NP hard problem. We propose a new framework, referring as AFSEM, to extract frequent cell combinations for design optimization. To solve this problem, we use a frequent subgraph mining method which is a process of discovering subgraphs. We present an advanced graph modeling and optimized frequent subgraph mining platform for a practical use. The experimental results with various designs demonstrate that the proposed method can discover various types of subcircuits for design optimization with various runtime optimization methods.

AB - The optimization of cells and cell combinations used in design is critical to enhance the performance. If frequently used cell combinations are known in advance, a new cell development can be significantly optimized using the cell combinations for chip design. However, extracting frequent cell combinations is an NP hard problem. We propose a new framework, referring as AFSEM, to extract frequent cell combinations for design optimization. To solve this problem, we use a frequent subgraph mining method which is a process of discovering subgraphs. We present an advanced graph modeling and optimized frequent subgraph mining platform for a practical use. The experimental results with various designs demonstrate that the proposed method can discover various types of subcircuits for design optimization with various runtime optimization methods.

UR - http://www.scopus.com/inward/record.url?scp=84983467841&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84983467841&partnerID=8YFLogxK

U2 - 10.1109/ISCAS.2016.7527327

DO - 10.1109/ISCAS.2016.7527327

M3 - Conference contribution

AN - SCOPUS:84983467841

T3 - Proceedings - IEEE International Symposium on Circuits and Systems

SP - 662

EP - 665

BT - ISCAS 2016 - IEEE International Symposium on Circuits and Systems

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 22 May 2016 through 25 May 2016

ER -

Kim BS, Won HS, Han T, Yang JS. AFSEM: Advanced frequent subcircuit extraction method by graph mining approach for optimized cell library developments. In ISCAS 2016 - IEEE International Symposium on Circuits and Systems. Institute of Electrical and Electronics Engineers Inc. 2016. p. 662-665. 7527327. (Proceedings - IEEE International Symposium on Circuits and Systems). doi: 10.1109/ISCAS.2016.7527327

AFSEM: Advanced frequent subcircuit extraction method by graph mining approach for optimized cell library developments

Abstract

Publication series

Other

Bibliographical note

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this