Adaptive detection and concealment algorithm of defective pixel

An Jeehoon, Lee Wonjae, Kim Jaeseok

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Citations (Scopus)

Abstract

This paper proposes a defective pixel detection algorithm for CCD/CMOS image sensors and its hardware architecture. In previous algorithms, the characteristics of images have not been considered and normal pixels can be treated as defective pixels with high possibility. In order to make up for those disadvantages, the proposed algorithm detects defective pixels by considering the characteristics of the image and verifies them using several frames while checking scene-changes. Whenever a scene-change is occurred, potentially defective pixels are detected and verified. The proposed algorithm was implemented with Verilog HDL. Total logic gate count was 5.1k using 0.25um CMOS standard cell library.

Original languageEnglish
Title of host publication2007 IEEE Workshop on Signal Processing Systems, SiPS 2007, Proceedings
Pages651-656
Number of pages6
DOIs
Publication statusPublished - 2007
Event2007 IEEE Workshop on Signal Processing Systems, SiPS 2007 - Shanghai, China
Duration: 2007 Oct 172007 Oct 19

Publication series

NameIEEE Workshop on Signal Processing Systems, SiPS: Design and Implementation
ISSN (Print)1520-6130

Other

Other2007 IEEE Workshop on Signal Processing Systems, SiPS 2007
Country/TerritoryChina
CityShanghai
Period07/10/1707/10/19

All Science Journal Classification (ASJC) codes

  • Media Technology
  • Signal Processing

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