Accurate time-domain angular jitter measurements for a high-speed polygon scanner

Youn Young Ji, Byung Hwy So, Won Sang Hwang, Don Geun Kim, Jun Woo Kim, Dug Young Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Angles of polygon scanners have been measured by using rotary encoders, autocollimators or indexing tables. These methods produce precise angle values but require removal of polygon mirror from its motor. For resolving this inconvenience, we introduce a simple angle measurement method by measuring timing jitters of a scanned beam in the time-domain with a high-speed detector and a digitizer while a polygon scanner is rotating at its full speed. Our setup includes a 635 nm wavelength semiconductor laser, a high-speed photodiode, two lenses, and a high-speed digitizer. A polygon scanner with 12 facets were tested with a rotating frequency of near 350 Hz. To detect the signal of the photodiode, we used a high speed digitizer which has a sampling rate of 2Gs/s with 256MB on-board memory. We obtained repeated pulsed sequential photodiode signals for 12 mirror facets of the scanner. Angle variations and their jitters for 12 scanner mirror facets were successfully calculated from measured data. We have repeated same experiments with a photomultiplier tube and compared results with those measured by a photodiode.

Original languageEnglish
Title of host publicationThree-Dimensional and Multidimensional Microscopy
Subtitle of host publicationImage Acquisition and Processing XXIV
EditorsThomas G. Brown, Tony Wilson, Carol J. Cogswell
PublisherSPIE
ISBN (Electronic)9781510605817
DOIs
Publication statusPublished - 2017
EventThree-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIV 2017 - San Francisco, United States
Duration: 2017 Jan 302017 Feb 1

Publication series

NameProgress in Biomedical Optics and Imaging - Proceedings of SPIE
Volume10070
ISSN (Print)1605-7422

Other

OtherThree-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIV 2017
Country/TerritoryUnited States
CitySan Francisco
Period17/1/3017/2/1

Bibliographical note

Publisher Copyright:
© 2017 SPIE.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Atomic and Molecular Physics, and Optics
  • Radiology Nuclear Medicine and imaging

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