Abstract
In order to accelerate the semiconductor device simulation, we propose to use a neural network to learn an approximate solution for desired bias conditions. With an initial solution (predicted by a trained neural network) sufficiently close to the final one, the computational cost to calculate several unnecessary solutions is significantly reduced. Specifically, a convolutional neural network for the metal-oxide-semiconductor field-effect transistor (MOSFET) is trained in a supervised manner to compute the initial solution. In particular, we propose to consider a device template for various devices and a compact expression of the solution based on the electrostatic potential. We empirically show that the proposed method accelerates the simulation significantly.
Original language | English |
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Pages (from-to) | 5483-5489 |
Number of pages | 7 |
Journal | IEEE Transactions on Electron Devices |
Volume | 68 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2021 Nov 1 |
Bibliographical note
Publisher Copyright:© 1963-2012 IEEE.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering