Abandoning the Bayer-Filter to See in the Dark

Xingbo Dong, Wanyan Xu, Zhihui Miao, Lan Ma, Chao Zhang, Jiewen Yang, Zhe Jin, Andrew Beng Jin Teoh, Jiajun Shen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Citations (Scopus)


Low-light image enhancement, a pervasive but challenging problem, plays a central role in enhancing the visibility of an image captured in a poor illumination environment. Due to the fact that not all photons can pass the Bayer-Filter on the sensor of the color camera, in this work, we first present a De-Bayer-Filter simulator based on deep neural networks to generate a monochrome raw image from the colored raw image. Next, a fully convolutional network is proposed to achieve the low-light image enhancement by fusing colored raw data with synthesized monochrome data. Channel-wise attention is also introduced to the fusion process to establish a complementary interaction between features from colored and monochrome raw images. To train the convolutional networks, we propose a dataset with monochrome and color raw pairs named Mono-Colored Raw paired dataset (MCR) collected by using a monochrome camera without Bayer-Filter and a color camera with Bayer-Filter. The proposed pipeline takes advantages of the fusion of the virtual monochrome and the color raw images, and our extensive experiments indicate that significant improvement can be achieved by leveraging raw sensor data and data-driven learning. The project is available at https://github.com/TCL-AILab/Abandon_Bayer-Filter_See_in_the_Dark.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
PublisherIEEE Computer Society
Number of pages10
ISBN (Electronic)9781665469463
Publication statusPublished - 2022
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022 - New Orleans, United States
Duration: 2022 Jun 192022 Jun 24

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
ISSN (Print)1063-6919


Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
Country/TerritoryUnited States
CityNew Orleans

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

All Science Journal Classification (ASJC) codes

  • Software
  • Computer Vision and Pattern Recognition


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