We report a new configuration of a reflection-type confocal scanning optical microscope system for measuring the refractive index profile of an optical waveguide. Several improvements on the earlier design are proposed; a light emitting diode at 650 nm wavelength instead of a laser diode or He-Ne laser is used as a light source for better index precision, and a simple longitudinal linear scanning and a curve fitting techniques are adapted instead of a servo control for maintaining an optical confocal arrangement. We have obtained spatial resolution of 800 nm and an index precision of 2 × 10-4. To verify the system's capability, the refractive index profiles of a conventional multimode fiber and a home-made four-mode fiber were examined with our proposed measurement method.
Bibliographical noteFunding Information:
This work was supported in part by the Korea Science and Engineering Foundation through the Ultra-Fast Fiber-Optic Networks Research Center and the Korean Ministry of Education and Human Resources Development through the Brain Korea 21 Program.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
- Electrical and Electronic Engineering