A scan segment skip technique for low power test

Engineering

• Electric Power Utilization 100%
• Experimental Result 50%
• Algorithm 50%
• Reduce Power Consumption 50%
• Area Overhead 50%
• Reduction Ratio 50%
• Semiconductor Manufacturing 50%
• Testing 50%
• Manufacturing Engineering 50%

Computer Science

• Power Consumption 100%
• Experimental Result 50%
• Reduce Power Consumption 50%
• Testing 50%

Physics

• Algorithms 50%
• Impact 50%