A scan segment skip technique for low power test

Hayoung Lee; Junkyu Lee; Hyunyul Lim; Sungho Kang

doi:10.1109/ISOCC.2015.7401669

A scan segment skip technique for low power test

Hayoung Lee, Junkyu Lee, Hyunyul Lim, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Citations (Scopus)

Abstract

Excessive power consumption during testing has been one of the most important issues from the exponential advance in semiconductor manufacturing technology. In this paper, a scan segment skip technique is proposed to reduce power consumption by skipping segments that don't need scan in/out processes. Also, a new pattern merge algorithm is proposed for maximizing power reduction ratio. Experimental results show that the proposed technique efficiently reduces test power consumption with the minimal impact on area overhead.

Original language	English
Title of host publication	ISOCC 2015 - International SoC Design Conference
Subtitle of host publication	SoC for Internet of Everything (IoE)
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	127-128
Number of pages	2
ISBN (Electronic)	9781467393089
DOIs	https://doi.org/10.1109/ISOCC.2015.7401669
Publication status	Published - 2016 Feb 8
Event	12th International SoC Design Conference, ISOCC 2015 - Gyeongju, Korea, Republic of Duration: 2015 Nov 2 → 2015 Nov 5

Publication series

Name	ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE)

Other

Other	12th International SoC Design Conference, ISOCC 2015
Country/Territory	Korea, Republic of
City	Gyeongju
Period	15/11/2 → 15/11/5

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/ISOCC.2015.7401669

Cite this

Lee, H., Lee, J., Lim, H., & Kang, S. (2016). A scan segment skip technique for low power test. In ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE) (pp. 127-128). Article 7401669 (ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE)). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISOCC.2015.7401669

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title = "A scan segment skip technique for low power test",

abstract = "Excessive power consumption during testing has been one of the most important issues from the exponential advance in semiconductor manufacturing technology. In this paper, a scan segment skip technique is proposed to reduce power consumption by skipping segments that don't need scan in/out processes. Also, a new pattern merge algorithm is proposed for maximizing power reduction ratio. Experimental results show that the proposed technique efficiently reduces test power consumption with the minimal impact on area overhead.",

author = "Hayoung Lee and Junkyu Lee and Hyunyul Lim and Sungho Kang",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 12th International SoC Design Conference, ISOCC 2015 ; Conference date: 02-11-2015 Through 05-11-2015",

year = "2016",

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doi = "10.1109/ISOCC.2015.7401669",

language = "English",

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Lee, H, Lee, J, Lim, H & Kang, S 2016, A scan segment skip technique for low power test. in ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE)., 7401669, ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE), Institute of Electrical and Electronics Engineers Inc., pp. 127-128, 12th International SoC Design Conference, ISOCC 2015, Gyeongju, Korea, Republic of, 15/11/2. https://doi.org/10.1109/ISOCC.2015.7401669

A scan segment skip technique for low power test. / Lee, Hayoung; Lee, Junkyu; Lim, Hyunyul et al.
ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE). Institute of Electrical and Electronics Engineers Inc., 2016. p. 127-128 7401669 (ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE)).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AU - Lee, Junkyu

AU - Lim, Hyunyul

AU - Kang, Sungho

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N2 - Excessive power consumption during testing has been one of the most important issues from the exponential advance in semiconductor manufacturing technology. In this paper, a scan segment skip technique is proposed to reduce power consumption by skipping segments that don't need scan in/out processes. Also, a new pattern merge algorithm is proposed for maximizing power reduction ratio. Experimental results show that the proposed technique efficiently reduces test power consumption with the minimal impact on area overhead.

AB - Excessive power consumption during testing has been one of the most important issues from the exponential advance in semiconductor manufacturing technology. In this paper, a scan segment skip technique is proposed to reduce power consumption by skipping segments that don't need scan in/out processes. Also, a new pattern merge algorithm is proposed for maximizing power reduction ratio. Experimental results show that the proposed technique efficiently reduces test power consumption with the minimal impact on area overhead.

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BT - ISOCC 2015 - International SoC Design Conference

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 12th International SoC Design Conference, ISOCC 2015

Y2 - 2 November 2015 through 5 November 2015

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Lee H, Lee J, Lim H, Kang S. A scan segment skip technique for low power test. In ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE). Institute of Electrical and Electronics Engineers Inc. 2016. p. 127-128. 7401669. (ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE)). doi: 10.1109/ISOCC.2015.7401669

A scan segment skip technique for low power test

Abstract

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Bibliographical note

All Science Journal Classification (ASJC) codes

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