TY - GEN
T1 - A random network ensemble for recognition
AU - Choi, Kwontaeg
AU - Toh, Kar Ann
AU - Byun, Hyeran
PY - 2009
Y1 - 2009
N2 - In this paper, we propose a random network ensemble for face recognition problem, particularly for images with a large appearance variation and with a limited number of training set. In order to reduce the correlation within the network ensemble using a single type of feature extractor and classifier, localized random facial features have been constructed together with internally randomized networks. The ensemble classifier is finally constructed by combining these multiple networks via a sum rule. The proposed method is shown to have a better accuracy(31.5% and 15.3% improvements on AR and EYALEB databases respectively) and a better efficiency than that of the widely used PCA- SVM.
AB - In this paper, we propose a random network ensemble for face recognition problem, particularly for images with a large appearance variation and with a limited number of training set. In order to reduce the correlation within the network ensemble using a single type of feature extractor and classifier, localized random facial features have been constructed together with internally randomized networks. The ensemble classifier is finally constructed by combining these multiple networks via a sum rule. The proposed method is shown to have a better accuracy(31.5% and 15.3% improvements on AR and EYALEB databases respectively) and a better efficiency than that of the widely used PCA- SVM.
UR - http://www.scopus.com/inward/record.url?scp=69949182469&partnerID=8YFLogxK
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U2 - 10.1007/978-3-642-01793-3_10
DO - 10.1007/978-3-642-01793-3_10
M3 - Conference contribution
AN - SCOPUS:69949182469
SN - 3642017924
SN - 9783642017926
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 92
EP - 101
BT - Advances in Biometrics - Third International Conference, ICB 2009, Proceedings
T2 - 3rd International Conference on Advances in Biometrics, ICB 2009
Y2 - 2 June 2009 through 5 June 2009
ER -