This paper proposes a X-filling method that reduces capture power during scan-based testing. The proposed method classifies scan cells for dividing the scan cells into some groups. Then, based on the divided groups, X-bits are filled simultaneously to reduce the computation time. Since the proposed method uses a novel grouping algorithm and fills X-bits based on groups, the proposed method reduces switching activity and computation time when compared with conventional X-filling methods. The simulation results show that the proposed method reduces the switching activity up to 70% and the number of simulations for the X-filling up to 52% compared with that of conventional X-filling methods.
Bibliographical notePublisher Copyright:
© IEICE 2017.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering