A new scan partition scheme for low-power embedded system

A new scan partition architecture to reduce both the average and peak power dissipation during scan testing is proposed for low-power embedded systems. In scan-based testing, due to the extremely high switching activity during the scan shift operation, the power consumption increases considerably. In addition, the reduced correlation between consecutive test patterns may increase the power consumed during the capture cycle. In the proposed architecture, only a subset of scan cells is loaded with test stimulus and captured with test responses by freezing the remaining scan cells according to the spectrum of unspecified bits in the test cubes. To optimize the proposed process, a novel graph-based heuristic to partition the scan chain into several segments and a technique to increase the number of don't cares in the given test set have been developed. Experimental results on large ISCAS89 benchmark circuits show that the proposed technique, compared to the traditional full scan scheme, can reduce both the average switching activities and the average peak switching activities by 92.37% and 41.21%, respectively.