TY - GEN
T1 - A new redundancy analysis algorithm using one side pivot
AU - Kim, Jooyoung
AU - Cho, Keewon
AU - Lee, Woosung
AU - Kang, Sungho
PY - 2015/4/16
Y1 - 2015/4/16
N2 - It is important to test the memory and repair faults for improving the memory yield. Many redundancy analysis (RA) algorithms have been developed to repair the memory faults. However, it is difficult to achieve high repair rate and fast analysis speed. The previous RA algorithms do not achieve both high repair rate and fast analysis speed. To overcome this problem, a new RA algorithm called one side pivot (OSP) is proposed. Using the property of pivot fault and its repair priority, the analysis time to find a solution can be reduced. The experimental results show that the proposed algorithm is efficient in terms of repair rate and analysis speed.
AB - It is important to test the memory and repair faults for improving the memory yield. Many redundancy analysis (RA) algorithms have been developed to repair the memory faults. However, it is difficult to achieve high repair rate and fast analysis speed. The previous RA algorithms do not achieve both high repair rate and fast analysis speed. To overcome this problem, a new RA algorithm called one side pivot (OSP) is proposed. Using the property of pivot fault and its repair priority, the analysis time to find a solution can be reduced. The experimental results show that the proposed algorithm is efficient in terms of repair rate and analysis speed.
UR - http://www.scopus.com/inward/record.url?scp=84929405775&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84929405775&partnerID=8YFLogxK
U2 - 10.1109/ISOCC.2014.7087609
DO - 10.1109/ISOCC.2014.7087609
M3 - Conference contribution
T3 - ISOCC 2014 - International SoC Design Conference
SP - 134
EP - 135
BT - ISOCC 2014 - International SoC Design Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th International SoC Design Conference, ISOCC 2014
Y2 - 3 November 2014 through 6 November 2014
ER -