Abstract
Since the automotive camera image processing system is highly related to the people's lives, the online test and debug method for the system is required to monitor the system in real-time and increase the reliability. However, there are errors and faults which escaped from the pre-silicon verification and the manufacturing test and they cause the test and debug time longer. Because the excessive time overhead has a bad influence upon the reliability, it is necessary to reduce the time overhead. To overcome this challenge, a new online test and debug methodology for the automotive camera image processing system is proposed in this paper. Experimental results show how the proposed methodology can reduce the time overhead significantly on various cases compared to the previous work.
| Original language | English |
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| Title of host publication | 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 370-371 |
| Number of pages | 2 |
| ISBN (Electronic) | 9781509015702 |
| DOIs | |
| Publication status | Published - 2017 Jan 3 |
| Event | 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016 - Jeju, Korea, Republic of Duration: 2016 Oct 25 → 2016 Oct 28 |
Publication series
| Name | 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016 |
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Other
| Other | 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016 |
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| Country/Territory | Korea, Republic of |
| City | Jeju |
| Period | 16/10/25 → 16/10/28 |
Bibliographical note
Funding Information:This work supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIP) (No. 2015R1A2A1A13001751)
Publisher Copyright:
© 2016 IEEE.
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
- Signal Processing