A new low energy BIST using a statistical code

Sunghoon Chun; Taejin Kim; Sungho Kang

doi:10.1109/ASPDAC.2008.4484031

A new low energy BIST using a statistical code

Sunghoon Chun, Taejin Kim, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Citations (Scopus)

Abstract

To tackle with the increased switching activity during the test operation, this paper proposes a new built-in self test (BIST) scheme for low energy testing that uses a statistical code and a new technique to skip unnecessary test sequences. From a general point of view, the goal of this technique is to minimize the total power consumption during a test and to allow the at-speed test in order to achieve high fault coverage. The effectiveness of the proposed low energy BIST scheme was validated on a set of ISCAS '89 benchmark circuits with respect to test data volume and energy saving.

Original language	English
Title of host publication	2008 Asia and South Pacific Design Automation Conference, ASP-DAC
Pages	647-652
Number of pages	6
DOIs	https://doi.org/10.1109/ASPDAC.2008.4484031
Publication status	Published - 2008
Event	2008 Asia and South Pacific Design Automation Conference, ASP-DAC - Seoul, Korea, Republic of Duration: 2008 Mar 21 → 2008 Mar 24

Publication series

Name	Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Other

Other	2008 Asia and South Pacific Design Automation Conference, ASP-DAC
Country/Territory	Korea, Republic of
City	Seoul
Period	08/3/21 → 08/3/24

All Science Journal Classification (ASJC) codes

Computer Science Applications
Computer Graphics and Computer-Aided Design
Electrical and Electronic Engineering

Access to Document

10.1109/ASPDAC.2008.4484031

Cite this

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title = "A new low energy BIST using a statistical code",

abstract = "To tackle with the increased switching activity during the test operation, this paper proposes a new built-in self test (BIST) scheme for low energy testing that uses a statistical code and a new technique to skip unnecessary test sequences. From a general point of view, the goal of this technique is to minimize the total power consumption during a test and to allow the at-speed test in order to achieve high fault coverage. The effectiveness of the proposed low energy BIST scheme was validated on a set of ISCAS '89 benchmark circuits with respect to test data volume and energy saving.",

author = "Sunghoon Chun and Taejin Kim and Sungho Kang",

year = "2008",

doi = "10.1109/ASPDAC.2008.4484031",

language = "English",

isbn = "9781424419227",

series = "Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC",

pages = "647--652",

booktitle = "2008 Asia and South Pacific Design Automation Conference, ASP-DAC",

note = "2008 Asia and South Pacific Design Automation Conference, ASP-DAC ; Conference date: 21-03-2008 Through 24-03-2008",

}

Chun, S, Kim, T & Kang, S 2008, A new low energy BIST using a statistical code. in 2008 Asia and South Pacific Design Automation Conference, ASP-DAC., 4484031, Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC, pp. 647-652, 2008 Asia and South Pacific Design Automation Conference, ASP-DAC, Seoul, Korea, Republic of, 08/3/21. https://doi.org/10.1109/ASPDAC.2008.4484031

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AU - Chun, Sunghoon

AU - Kim, Taejin

AU - Kang, Sungho

PY - 2008

Y1 - 2008

N2 - To tackle with the increased switching activity during the test operation, this paper proposes a new built-in self test (BIST) scheme for low energy testing that uses a statistical code and a new technique to skip unnecessary test sequences. From a general point of view, the goal of this technique is to minimize the total power consumption during a test and to allow the at-speed test in order to achieve high fault coverage. The effectiveness of the proposed low energy BIST scheme was validated on a set of ISCAS '89 benchmark circuits with respect to test data volume and energy saving.

AB - To tackle with the increased switching activity during the test operation, this paper proposes a new built-in self test (BIST) scheme for low energy testing that uses a statistical code and a new technique to skip unnecessary test sequences. From a general point of view, the goal of this technique is to minimize the total power consumption during a test and to allow the at-speed test in order to achieve high fault coverage. The effectiveness of the proposed low energy BIST scheme was validated on a set of ISCAS '89 benchmark circuits with respect to test data volume and energy saving.

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DO - 10.1109/ASPDAC.2008.4484031

M3 - Conference contribution

AN - SCOPUS:49549085242

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T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

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BT - 2008 Asia and South Pacific Design Automation Conference, ASP-DAC

T2 - 2008 Asia and South Pacific Design Automation Conference, ASP-DAC

Y2 - 21 March 2008 through 24 March 2008

ER -

A new low energy BIST using a statistical code

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