A new in-field bad block detection scheme for NAND flash chips

Dongho Kang, Keewon Cho, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


A NAND flash system has been adopted as storage. However, due to its distinctive operation mechanisms, it endures only the limited number of program/Erase cycles. So, bad blocks are inevitably developed during the life time of the storage system. A bad block is a block that contains faulty bits that cannot be covered by ECC. In this paper, a novel in-field bad block detection scheme is proposed. Through simple write verifications, the proposed bad block detector finds bad blocks in real-time, and ensures that written data is reliable. The detection method includes neither costly data-mirroring nor complex ECC processing, but it requires an additional detection module of which size is less than 0.15% of the controller size.

Original languageEnglish
Title of host publicationISOCC 2015 - International SoC Design Conference
Subtitle of host publicationSoC for Internet of Everything (IoE)
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages2
ISBN (Electronic)9781467393089
Publication statusPublished - 2016 Feb 8
Event12th International SoC Design Conference, ISOCC 2015 - Gyeongju, Korea, Republic of
Duration: 2015 Nov 22015 Nov 5

Publication series

NameISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE)


Other12th International SoC Design Conference, ISOCC 2015
Country/TerritoryKorea, Republic of

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials


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