A new analog-to-digital converter BIST considering a transient zone

Incheol Kim; Kicheol Kim; Youbean Kim; Hyeonuk Son; Sungho Kang

doi:10.1093/ietele/e90-c.11.2161

A new analog-to-digital converter BIST considering a transient zone

Incheol Kim, Kicheol Kim, Youbean Kim, Hyeonuk Son, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

A new BIST (Built-in Self-test) method for static ADC testing is proposed. The proposed method detects offset, gain, INL (Integral Non-linearity) and DNL (Differential Non-linearity) errors with a low hardware overhead. Moreover, it can solve a transient zone problem which is derived from the ADC noise in real test environments.

Original language	English
Pages (from-to)	2161-2163
Number of pages	3
Journal	IEICE Transactions on Electronics
Volume	E90C
Issue number	11
DOIs	https://doi.org/10.1093/ietele/e90-c.11.2161
Publication status	Published - 2007

Bibliographical note

Publisher Copyright:
© 2007 The Institute of Electronics, Information and Communication Engineers.

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1093/ietele/e90-c.11.2161

Cite this

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A new analog-to-digital converter BIST considering a transient zone

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

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