Abstract
Sequential lateral solidification (SLS) thin-film transistors (TFTs) offer higher performance than conventional excimer laser-annealed TFTs. However, their performance has an anisotropy originating from the polycrystalline silicon (p-Si) microstructure. The properties of TFTs with channel direction parallel to the lateral growth (parallel TFTs) are superior to those of TFTs with a perpendicular channel direction (perpendicular TFTs). The multi-channel structure proposed in this paper, which directly incorporates a parallel component in a perpendicular TFT, exhibits greatly improved properties. This MC structure can be applied not only to p-Si produced by SLS, but also to any material with property anisotropy.
Original language | English |
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Article number | 202103 |
Journal | Applied Physics Letters |
Volume | 97 |
Issue number | 20 |
DOIs | |
Publication status | Published - 2010 Nov 15 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)