A Low-Voltage Area-Efficient TSV I/O for HBM with Data Rate up to 15Gb/s Featuring Overlapped Multiplexing Driver, ISI Compensators and QEC

Taeryeong Kim, Ji Young Kim, Jeonghyeok You, Hohyun Chae, Byoung Mo Moon, Kyomin Sohn, Seong Ook Jung

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper presents a low-voltage area-efficient through-silicon via (TSV) I/O for the high-bandwidth memory utilizing overlapped multiplexing driver, ISI compensators (hybrid equalizer, direct feedback 1-tap DFE) and quadrature error corrector. The proposed TSV I/O is implemented in 65nm CMOS process with emulated 12-stacked TSV. Measurement results show energy efficiency of 0.145pJ/b/pF and 30% timing margin with BER < 10-12 at 15Gb/s with PRBS-31.

Original languageEnglish
Title of host publication2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9784863488069
DOIs
Publication statusPublished - 2023
Event2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023 - Kyoto, Japan
Duration: 2023 Jun 112023 Jun 16

Publication series

NameDigest of Technical Papers - Symposium on VLSI Technology
Volume2023-June
ISSN (Print)0743-1562

Conference

Conference2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023
Country/TerritoryJapan
CityKyoto
Period23/6/1123/6/16

Bibliographical note

Publisher Copyright:
© 2023 JSAP.

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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