A Low Power TSV I/O with Data Rate up to 10 Gb/s for Next Generation HBM

Ji Young Kim, Taeryeong Kim, Jeonghyeok You, Kiryong Kim, Byoung Mo Moon, Kyomin Sohn, Seong Ook Jung

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

A low power through-silicon via (TSV) I/O for the high-bandwidth memory is proposed with a 65nm CMOS process. The proposed TSV I/O, which employs a low-supply voltage for low-power operation, consists of a 4-to-1 multiplexer (MUX) with replica MUX, pre-driver that realizes pre-emphasis without static power consumption, and digitally calibrated 1-to-4 de-MUX comparator. The measured energy efficiency is 0.179-0.185pJ/b/pF with a PRBS-31 at 5-10Gb/s.

Original languageEnglish
Title of host publication2022 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages152-153
Number of pages2
ISBN (Electronic)9781665497725
DOIs
Publication statusPublished - 2022
Event2022 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2022 - Honolulu, United States
Duration: 2022 Jun 122022 Jun 17

Publication series

NameDigest of Technical Papers - Symposium on VLSI Technology
Volume2022-June
ISSN (Print)0743-1562

Conference

Conference2022 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2022
Country/TerritoryUnited States
CityHonolulu
Period22/6/1222/6/17

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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