A hybrid fiber-optic photoluminescence measurement system and its application in InGaN/GaN light emitting diode epi-wafer morphology studies

Sohee An; Yong Gon Seo; Woohyun Jung; Minkyu Park; Jiyoung Park; Jongki Kim; Yoonseob Jeong; Kyunghwan Oh

doi:10.1364/OE.20.019535

A hybrid fiber-optic photoluminescence measurement system and its application in InGaN/GaN light emitting diode epi-wafer morphology studies

Sohee An, Yong Gon Seo, Woohyun Jung, Minkyu Park, Jiyoung Park, Jongki Kim, Yoonseob Jeong, Kyunghwan Oh

Department of Physics

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

We report a fiber optic photoluminescence (PL) measurement system using a novel hybrid probe composed of a series of single mode fiber (SMF) and double-clad fiber (DCF) terminated with a coreless silica fiber (CSF) segment and glass micro-lens formed on its cleaved-facet. The fiber probe provided a good guidance and focusing capability for the excitation photon with a focal length of 125 μm and a beam diameter of 13.6 μm. Utilizing a special DCF-to-DCF coupling schemethe photoluminescence signals were efficiently collected and delivered to a photodetector with a low loss. Utilizing the proposed systemPL morphology was investigated over a 200 × 200 μm2 area for two types of InGaN/GaN blue light emitting diode (LED) epi-wafers grown on 1) an un-patterned sapphire substrate (UPSS)and 2) a patterned sapphire substrate (PSS). The uniformity in the relative PL intensity and the spectral uniformity in terms of the peak PL wavelength were experimentally compared and analyzed.

Original language	English
Pages (from-to)	19535-19544
Number of pages	10
Journal	Optics Express
Volume	20
Issue number	17
DOIs	https://doi.org/10.1364/OE.20.019535
Publication status	Published - 2012 Aug 13

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics

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10.1364/OE.20.019535

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title = "A hybrid fiber-optic photoluminescence measurement system and its application in InGaN/GaN light emitting diode epi-wafer morphology studies",

abstract = "We report a fiber optic photoluminescence (PL) measurement system using a novel hybrid probe composed of a series of single mode fiber (SMF) and double-clad fiber (DCF) terminated with a coreless silica fiber (CSF) segment and glass micro-lens formed on its cleaved-facet. The fiber probe provided a good guidance and focusing capability for the excitation photon with a focal length of 125 μm and a beam diameter of 13.6 μm. Utilizing a special DCF-to-DCF coupling schemethe photoluminescence signals were efficiently collected and delivered to a photodetector with a low loss. Utilizing the proposed systemPL morphology was investigated over a 200 × 200 μm2 area for two types of InGaN/GaN blue light emitting diode (LED) epi-wafers grown on 1) an un-patterned sapphire substrate (UPSS)and 2) a patterned sapphire substrate (PSS). The uniformity in the relative PL intensity and the spectral uniformity in terms of the peak PL wavelength were experimentally compared and analyzed.",

author = "Sohee An and Seo, {Yong Gon} and Woohyun Jung and Minkyu Park and Jiyoung Park and Jongki Kim and Yoonseob Jeong and Kyunghwan Oh",

year = "2012",

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doi = "10.1364/OE.20.019535",

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AU - An, Sohee

AU - Seo, Yong Gon

AU - Jung, Woohyun

AU - Park, Minkyu

AU - Park, Jiyoung

AU - Kim, Jongki

AU - Jeong, Yoonseob

AU - Oh, Kyunghwan

PY - 2012/8/13

Y1 - 2012/8/13

N2 - We report a fiber optic photoluminescence (PL) measurement system using a novel hybrid probe composed of a series of single mode fiber (SMF) and double-clad fiber (DCF) terminated with a coreless silica fiber (CSF) segment and glass micro-lens formed on its cleaved-facet. The fiber probe provided a good guidance and focusing capability for the excitation photon with a focal length of 125 μm and a beam diameter of 13.6 μm. Utilizing a special DCF-to-DCF coupling schemethe photoluminescence signals were efficiently collected and delivered to a photodetector with a low loss. Utilizing the proposed systemPL morphology was investigated over a 200 × 200 μm2 area for two types of InGaN/GaN blue light emitting diode (LED) epi-wafers grown on 1) an un-patterned sapphire substrate (UPSS)and 2) a patterned sapphire substrate (PSS). The uniformity in the relative PL intensity and the spectral uniformity in terms of the peak PL wavelength were experimentally compared and analyzed.

AB - We report a fiber optic photoluminescence (PL) measurement system using a novel hybrid probe composed of a series of single mode fiber (SMF) and double-clad fiber (DCF) terminated with a coreless silica fiber (CSF) segment and glass micro-lens formed on its cleaved-facet. The fiber probe provided a good guidance and focusing capability for the excitation photon with a focal length of 125 μm and a beam diameter of 13.6 μm. Utilizing a special DCF-to-DCF coupling schemethe photoluminescence signals were efficiently collected and delivered to a photodetector with a low loss. Utilizing the proposed systemPL morphology was investigated over a 200 × 200 μm2 area for two types of InGaN/GaN blue light emitting diode (LED) epi-wafers grown on 1) an un-patterned sapphire substrate (UPSS)and 2) a patterned sapphire substrate (PSS). The uniformity in the relative PL intensity and the spectral uniformity in terms of the peak PL wavelength were experimentally compared and analyzed.

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A hybrid fiber-optic photoluminescence measurement system and its application in InGaN/GaN light emitting diode epi-wafer morphology studies

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