We present a computer algorithm for layer number estimation of few-layered two-dimensional materials. Based on the optical contrast method, this algorithm analyzes an optical microscope image in a few seconds with high accuracy over 90%.
|Title of host publication||2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Publication status||Published - 2018 Aug 6|
|Event||2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States|
Duration: 2018 May 13 → 2018 May 18
|Name||2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings|
|Other||2018 Conference on Lasers and Electro-Optics, CLEO 2018|
|Period||18/5/13 → 18/5/18|
Bibliographical notePublisher Copyright:
© 2018 OSA.
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics