Abstract
This paper presents a DFT controller called as a TCU (Test Control Unit), which considerably improves the efficiency of the instruction-based functional test. Internal program/data buses are completely controllable and observable by the TCU during the test cycle. Diverse test modes of the TCU can increase the test efficiency and also provide complete access to program/data memories for functional test.
| Original language | English |
|---|---|
| Pages (from-to) | 2070-2072 |
| Number of pages | 3 |
| Journal | IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences |
| Volume | E84-A |
| Issue number | 8 |
| Publication status | Published - 2001 Aug |
All Science Journal Classification (ASJC) codes
- Signal Processing
- Computer Graphics and Computer-Aided Design
- Electrical and Electronic Engineering
- Applied Mathematics