TY - GEN
T1 - A comparative study of STT-MTJ based non-volatile flip-flops
AU - Na, Taehui
AU - Ryu, Kyungho
AU - Kim, Jisu
AU - Kang, Seung H.
AU - Jung, Seong Ook
PY - 2013
Y1 - 2013
N2 - In this paper, we categorize STT-MTJ based non-volatile flip-flops (NV-FF) into two basic structures: Merged latch and sensing circuit (MLS) structure and separated latch and sensing circuit (SLS) structure. We also analyze the two structures with various types of sensing and write circuits. HSPICE simulation results using the industry-compatible 45-nm model parameter shows the SLS structure has better performance according to D-Q delay, PDP, and sensing current than the MLS structure because the SLS structure can optimize the FF operation and the sensing operation independently. Among various types of sensing circuit, the cross coupled inverter based sensing circuit including two MTJs and the single ended sensing circuit including two MTJs show better performances on low sensing current and high yield.
AB - In this paper, we categorize STT-MTJ based non-volatile flip-flops (NV-FF) into two basic structures: Merged latch and sensing circuit (MLS) structure and separated latch and sensing circuit (SLS) structure. We also analyze the two structures with various types of sensing and write circuits. HSPICE simulation results using the industry-compatible 45-nm model parameter shows the SLS structure has better performance according to D-Q delay, PDP, and sensing current than the MLS structure because the SLS structure can optimize the FF operation and the sensing operation independently. Among various types of sensing circuit, the cross coupled inverter based sensing circuit including two MTJs and the single ended sensing circuit including two MTJs show better performances on low sensing current and high yield.
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U2 - 10.1109/ISCAS.2013.6571794
DO - 10.1109/ISCAS.2013.6571794
M3 - Conference contribution
AN - SCOPUS:84883324875
SN - 9781467357609
T3 - Proceedings - IEEE International Symposium on Circuits and Systems
SP - 109
EP - 112
BT - 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
T2 - 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
Y2 - 19 May 2013 through 23 May 2013
ER -