A CMOS image sensor with reset level control using dynamic reset current source for noise suppression

Kwang Hyun Lee; Euisik Yoon

A CMOS image sensor with reset level control using dynamic reset current source for noise suppression

Kwang Hyun Lee, Euisik Yoon

Yonsei Advanced Science Institute

Research output: Contribution to journal › Conference article › peer-review

9 Citations (Scopus)

Abstract

A 512 × 384 CMOS image sensor in 0.18μm 1P4M technology with 5.9μm pixel pitch and a dynamic reset current source to compensate for kTC reset noise and fixed pattern noise is presented. A total of 390μV(rms) readout noise, and a factor of two improvement over conventional reset is achieved. The chip operates at 1.8V and consumes 40mW excluding I/O and off-chip DAC for a single-slope ADC at 24frames/s.

Original language	English
Pages (from-to)	114-115+107+516
Journal	Digest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume	47
Publication status	Published - 2004
Event	Digest of Technical Papers - 2004 IEEE International Solid-State Circuits Conference - San Francisco, CA., United States Duration: 2003 Feb 15 → 2003 Feb 19

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Cite this

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title = "A CMOS image sensor with reset level control using dynamic reset current source for noise suppression",

abstract = "A 512 × 384 CMOS image sensor in 0.18μm 1P4M technology with 5.9μm pixel pitch and a dynamic reset current source to compensate for kTC reset noise and fixed pattern noise is presented. A total of 390μV(rms) readout noise, and a factor of two improvement over conventional reset is achieved. The chip operates at 1.8V and consumes 40mW excluding I/O and off-chip DAC for a single-slope ADC at 24frames/s.",

author = "Lee, {Kwang Hyun} and Euisik Yoon",

year = "2004",

language = "English",

volume = "47",

pages = "114--115+107+516",

journal = "Digest of Technical Papers - IEEE International Solid-State Circuits Conference",

issn = "0193-6530",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "Digest of Technical Papers - 2004 IEEE International Solid-State Circuits Conference ; Conference date: 15-02-2003 Through 19-02-2003",

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T1 - A CMOS image sensor with reset level control using dynamic reset current source for noise suppression

AU - Lee, Kwang Hyun

AU - Yoon, Euisik

PY - 2004

Y1 - 2004

N2 - A 512 × 384 CMOS image sensor in 0.18μm 1P4M technology with 5.9μm pixel pitch and a dynamic reset current source to compensate for kTC reset noise and fixed pattern noise is presented. A total of 390μV(rms) readout noise, and a factor of two improvement over conventional reset is achieved. The chip operates at 1.8V and consumes 40mW excluding I/O and off-chip DAC for a single-slope ADC at 24frames/s.

AB - A 512 × 384 CMOS image sensor in 0.18μm 1P4M technology with 5.9μm pixel pitch and a dynamic reset current source to compensate for kTC reset noise and fixed pattern noise is presented. A total of 390μV(rms) readout noise, and a factor of two improvement over conventional reset is achieved. The chip operates at 1.8V and consumes 40mW excluding I/O and off-chip DAC for a single-slope ADC at 24frames/s.

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M3 - Conference article

AN - SCOPUS:2442691458

SN - 0193-6530

VL - 47

SP - 114-115+107+516

JO - Digest of Technical Papers - IEEE International Solid-State Circuits Conference

JF - Digest of Technical Papers - IEEE International Solid-State Circuits Conference

T2 - Digest of Technical Papers - 2004 IEEE International Solid-State Circuits Conference

Y2 - 15 February 2003 through 19 February 2003

ER -

A CMOS image sensor with reset level control using dynamic reset current source for noise suppression

Abstract

All Science Journal Classification (ASJC) codes

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