A clustered RIN BIST based on signal probabilities of deterministic test sets

Dong Sup Song; Sungho Kang

doi:10.1093/ietisy/e89-d.1.354

A clustered RIN BIST based on signal probabilities of deterministic test sets

Dong Sup Song, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

In this paper, we propose a new clustered reconfigurable interconnect network (CRIN) BIST that can improve the embedding probabilities of random-pattern-resistant-patterns. A simulated annealing based algorithm that maximizes the embedding probabilities of scan test cubes has been developed to reorder scan cells. Experimental results demonstrate that the proposed CRIN BIST technique reduces test time by 35% and the storage requirement by 39% in comparison with previous work.

Original language	English
Pages (from-to)	354-357
Number of pages	4
Journal	IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Volume	E89-A
Issue number	1
DOIs	https://doi.org/10.1093/ietisy/e89-d.1.354
Publication status	Published - 2006 Jan

All Science Journal Classification (ASJC) codes

Signal Processing
Computer Graphics and Computer-Aided Design
Electrical and Electronic Engineering
Applied Mathematics

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A clustered RIN BIST based on signal probabilities of deterministic test sets

Abstract

All Science Journal Classification (ASJC) codes

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