The proposed built-in self-test(BIST) architecture aims at multiple digital-to-analog converters (DACs) in a low temperature poly-silicon(LTPS) based thin-film transistor liquid crystal display(TFT-LCD) source driver IC. DACs play an important role in display driver ICs(DDIs), so the proposed BIST is indispensable for DDIs' testing. The proposed BIST can compute differential non-linearity(DNL), integral nonlinearity(INL) and timing errors using some basic modules. The proposed architecture benefits the hardware overhead and the test application time without the loss of test quality. The validity and the effectiveness of the proposed method are verified through HSPICE simulations with an LTPS process.