Abstract
A new 1.25-Gb/s digitally-controlled dual-loop clock and data recovery circuit is realized. To overcome jitter problems caused by the phase resolution limit, the CDR has two phase generation stages: coarse generation by a phase interpolator and fine generation by a variable delay buffer. The performance of the proposed CDR was verified by behavioral and transistor-level simulations. A prototype CDR chip fabricated with 0.18 μm CMOS process shows error-free operation for ±400 ppm frequency offset. The chip occupies 165 × 255 μm2 and consumes 17.8 mW.
Original language | English |
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Pages (from-to) | 165-169 |
Number of pages | 5 |
Journal | IEICE Transactions on Electronics |
Volume | E90-C |
Issue number | 1 |
DOIs | |
Publication status | Published - 2007 Jan |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering