Engineering
Networks (Circuits)
100%
Sense Amplifier
82%
Yields
69%
Transistor
62%
Electric Potential
59%
Energy Engineering
59%
Bit Line
55%
Performance
54%
Supply Voltage
53%
Models
42%
Random Access Memory
39%
Process Variation
37%
High Speed
36%
Stability
34%
Interconnects
32%
Flip Flop Circuits
30%
Electric Power Utilization
30%
Nodes
29%
Spin Transfer
28%
Couplings
28%
Simulation Result
27%
Design
22%
Field-Effect Transistor
22%
Area Overhead
22%
Nonvolatile Memory
22%
Offset Voltage
21%
Stages
21%
Architecture
19%
Generators
19%
Locked Loop
19%
Scaling
17%
Phase Shift
16%
Noise Margin
16%
Low Voltage
15%
Duty Cycle
15%
Applications
15%
High Density
14%
Thermal Sensor
14%
Optimization
14%
Model Parameter
14%
Energy Conservation
14%
Products
14%
Experimental Result
13%
Coupling Effect
13%
Characteristics
13%
Simulation
13%
Error
13%
Contention
12%
Hold Time
12%
Logic Circuit
12%
Computer Science
Static Random Access Memory
76%
Supply Voltage
67%
Simulation Mode
65%
Simulation
63%
Random Access Memory
60%
Threshold Voltage
49%
Nonvolatile
47%
Process Variation
43%
Flip-Flop
43%
Power Consumption
41%
Design
40%
Bitline
34%
Content-Addressable Memory
34%
Non-Volatile Memory
30%
Energy Consumption
25%
Write Operation
25%
Experimental Result
23%
Ring Oscillator
20%
Functions
19%
Read Operation
19%
Clock Frequency
18%
Convolutional Neural Network
18%
Flash Memory
18%
Bit Cell
17%
Optimization
17%
Evaluation
16%
Amplifier
16%
Leakage Current
16%
Generation
16%
Noise Margin
15%
Control
15%
Jitter
13%
Input/Output
13%
Operating Frequency
13%
Computing
13%
Energy Efficiency
13%
Parameter Model
13%
Energy Efficient
12%
Reference Scheme
12%
Fault Coverage
12%
Scan Chain
12%
Memory Architecture
12%
Accuracy
11%
Application
11%
Offset Voltage
11%
Shifters
10%
Parasitic Resistance
10%
Logic Gate
10%
Internet of Things
10%
Sensor
9%
