United States Patent for Device for Measuring Threshold Voltage of a Transistor Based on Constant Drain Voltage and Constant Drain Source Current Issued to SK Hynix and Industry-Academic Cooperation Foundation Yonsei University

Press/Media: Press / Media

Period2018 Jun 5

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  • TitleUnited States Patent for Device for Measuring Threshold Voltage of a Transistor Based on Constant Drain Voltage and Constant Drain Source Current Issued to SK Hynix and Industry-Academic Cooperation Foundation Yonsei University
    Media name/outletGlobal IP News. Semiconductor Patent News
    Country/TerritoryIndia
    Date18/6/5
    PersonsHyun Mee Kim, Jung-Hyun Kim
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